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Efficient test data compression and low power scan testing in SoCs
Efficient test data compression and low power scan testing in SoCs
- Material Type
- 교내논문
- Callnumber
- KM70 정준모
- Author
- 정준모
- Title/Author
- Efficient test data compression and low power scan testing in SoCs / 정준모
- Publish Info
- 서울 : ETRI Journal, 2003
- Material Info
- 책 p. ; 24 cm
- Added Entry-Title
- ETRI Journal ; 제25권 제5호
- Electronic Location and Access
- :: 로그인 후 이용바랍니다. ::
- Control Number
- kpcl:135465